Thus, the exposure
https://www.selleckchem.com/products/NVP-AUY922.html of the In2O3 NPs to the N2O plasma was 10058-F4 price assumed to be negligible in this region. Heat transferred from the upper to the lower layer of the In2O3 NPs provided excessive energy for the reconstruction of the structure of the NPs. The NPs confined between the upper layer and substrate had enough space to reorganize to their preferred shapes. According to the surface energy of In2O3, γ111 < γ100 < γ110, the 111 plane possesses the lowest surface energy [32]. From the HRTEM analysis (Additional file 1: Figure S4), most of the In2O3 NPs were showing the (222) crystallographic plane. The NPs tended to reorganize in order to maximize the more stable 111 plane. One possible way was to arrange them vertically along the [100] or [110] direction with the lateral facet in the 111 plane. This explains the vertical alignment of the In2O3 NPs to form a rod-like structure in the bottom layer of the sample. Conclusions In summary, we demonstrated an effective method to enhance the crystal structure, direct transition absorption, and electrical conductivity of In2O3 NPs by introducing a thermal radiation treatment. We attributed these enhancements to the improvement in
the microstructure of the In2O3 NPs to the nanostructured In2O3 films. This tractable and tunable microstructure deformation process is useful in a variety of In2O3-related technologies. Acknowledgements This work was supported see more by the UM/MOHE High Impact Research Grant Allocation of F000006-21001, the Fundamental Research Grant Scheme (FRGS) of KPT1058-2012, and the University Malaya Research Grant (UMRG) of RG205-11AFR and RP007B-13AFR. Electronic supplementary material Additional file 1: Supplementary information. Figure S1. Schematic diagram and real time photographs of our home-built PA-HWCVD system. Figure S2. Photograph of
the In2O3 NPs coated on quartz substrate (a) without, and (b) with thermal radiation IKBKE treatment in N2O plasma. Figure S3. PL spectra of the untreated In2O3 NPs, thermal radiation treated In2O3 NPs for 7 and 10 minutes. Figure S4. HRTEM micrographs of the In2O3 nanocrystals with different facets ranging from (a) 3, (b) 4 to (c) 5 facets observed in the nanostructured In2O3 films. Figure S5. Tauc plots of (αE)2 against E for the In2O3 NPs and nanostructured In2O3 films. Figure S6. Planar view FESEM images of the In2O3 NPs deposited on quartz substrate (a) without, and (b and c) with thermal radiation treatment. (DOCX 2 MB) References 1. Walsh A, Da Silva JLF, Wei SH, Korber C, Klein A, Piper LFJ, DeMasi A, Smith KE, Panaccione G, Torelli P, Payne DJ, Bourlange A, Egdell RG: Nature of the band gap of In 2 O 3 revealed by first-principles calculations and X-ray spectroscopy. Phys Rev Lett 2008, 100:167402.CrossRef 2.